Phoenix AZ, October 30, 2024 Kanomax FMT, Inc., a leader in high-precision particle and aerosol measurement technology, is set to make a significant impact at Ultra Facility 2024, the premier conference for high-purity chemical metrology in the semiconductor industry. Senior Applications Engineer Jikku Thomas and Research Scientist Derek Oberreit will present Kanomax FMT’s innovative research and lead discussions on contamination measurement technology designed to meet the rigorous needs of high-purity…
Ultra-Sensitive Particle Detection for Total Contamination Control Introducing the Scanning Threshold Particle Counter Model STPC 3+ provides industry-leading particle detection down to 3 nm, helping you maintain critical contamination control. Monitor and eliminate even the smallest contamination risks with the highest sensitivity particle counter in its class. Benefits of Scanning TPC3 Plus Improved corrosion resistance for hydrochloric and sulfuric acid measurements Automated dilution control for extended dynamic range Can use water-based CPC…
Kanomax FMT is thrilled to announce its participation in the European Aerosol Conference (EAC) 2024, scheduled from August 25-30 in Tampere, Finland. As a leader in aerosol measurement technology, Kanomax FMT will showcase its innovative solutions…
ABSTRACT – CMP is extensively used in silica-based semiconductor manufacturing, and the post CMP cleaning…
Kanomax FMT is the World Leader in Sub 20-nm Particle Measurement. With instruments that measure particles down to 2nm…
Kanomax FMT is the World Leader in Sub 20-nm Particle Measurement. With instruments that measure particles down to 2nm…
The Fast Condensation Particle Counter (FCPC) is the world’s fastest commercially available condensation particle counter…
Accurate measurement of particles in colloidal suspensions is very important in many applications. For example, in Chemical Mechanical Polishing…
Current particle counting technology in Ultra Pure Water (UPW) using optical particle detection is limited to particles greater than about 30 nm under ideal conditions…